Ocean Optics - Inventor of the World's First Miniature Spectrometer
Ocean Optics - Inventor of the World's First Miniature Spectrometer
 

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Ocean Optics - Inventor of the World's First Miniature Spectrometer

 

Our range of high-precision metrology tools for thin film measurement, plasma analysis and optical characterization are fully integrated with software and applications database support. Each of these metrology products incorporates Ocean Optics miniature fiber optic spectroscopy technology.

Not sure which is right for you? Contact an Ocean Optics Applications Scientist for details.

 NanoCalc Thin Film Reflectometry System
Analyze the thickness of optical layers from 10 nm to ~250 µm
   
PlasCalc Plasma Monitoring and Control
Measure plasma emission from 200 to 1100 nm in only 3 milliseconds.
   
SpecEL Ellipsometer System
Measure polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelength

 
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